CONFERENCES  IN  INSTRUMENTATION

Monday 24th

SESSION BI: Instrumentation, Chair: G. González

(Invited) PROGRESS OF X-RAY ANALYSIS IN TRANSMISSION ELECTRON MICROSCOPES FROM 1977 TO 2007 AND TOWARD THE FUTURE

David WILLIAMS and Masashi Watanabe

(Invited) X-RAY EMISSION SPECTROMETRY OF BIMETALLIC NANOPARTICLES IN AN ABERRATION-CORRECTED ANALYTICAL ELECTRON MICROSCOPE

Charles LYMAN, P. Dimick, H. Li and R. Herman

(Invited) ELECTRON HOLOGRAPHY IN THE TEM: ANALYSIS OF STRUCTURE AND INTRINSIC FIELDS

Hannes LICHTE

Session BII Instrumentation, Chair: C. Lyman

(Invited) 5th ORDER ABERRATION CORRECTED STEM: INITIAL RESULTS AND PROSPECTS

Andrew BLELOCH, Peng Weng and Mhairi Gass

(Invited) ABERRATION-CORRECTED STEM: PAST, PRESENT AND FUTURE

Ondrej L. KRIVANEK, George Corbin, Niklas Dellby, Brian Elston, Robert Keyse, Matt Murfitt, Christopher S. Own and Zoltan S. Szilagyi

(Invited) CS-CORRECTOR STEM, HIGH-RESOLUTION TEM AND IN-SITU TEM APPLIED TO PT AND PT-BASED ALLOY NANOPARTICLES FOR FUEL CELLS

Paulo J. FERREIRA, Shuo Chen, Y. Shao-Horn, Larry Allard

(Invited) ATOMIC RESOLUTION CS-CORRECTED HR-S/TEM FROM 80-300KV: OPTIMIZING FOR TECHNIQUE AND MATERIAL

B. FREITAG, M. Stekelenburg, J. Ringnalda, and D. Hubert

(Invited) Controlling the dimensions of nano-structured materials using FIB SEM

Oliver Wilhelmi, Steve Reyntjens, Debbie J STOKES, Laurent Roussel and Dominique Hubert

Tuesday 25th

SESSION B III : Instrumentation,  Chair: R.Reichelt

(Invited) COMBINING THE FIB AND TEM TO PROBE THE STRUCTURE AND PROPERTIES OF MATERIALS R. SINCLAIR, K. Min and J. Seok Park

(Invited) TOMOGRAPHY IN HIGH RESOLUTION ELECTRON MICROSCOPY: SIMULATION RESULTS FOR A PLAUSIBLE FUTURE USEFUL TECHNIQUE

H. A. CALDERON, J. R. Jinschek, K. J. Batenburg, R. Kilaas, V. Radmilovic, C. F. Kisielowski.

(Invited) HRSTEM AND NANOTOMOGRAPHY IN RARE EARTH OXIDES NANOPARTICLES FOR LUMINISCENT APPLICATIONS

Luz Stella GÓMEZ, M.E. Rabanal, E. Sourty, B. Freitag, O.Milosevic

(Invited) ELECTRON BACKSCATTERING DIFFRACTION (EBSD): PROBLEMS AND PROGRESS

Alwyn EADES

SESSION B IV : Instrumentation, Chair: H. Calderon

(Invited) ATOMIC FORCE (AFM) AND HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPY (HRSEM): A COMPLEMENTARY POWERFUL COUPLE  

Rudolf REICHELT

(Invited) MINCALC-V5, A SOFTWARE TOOL FOR MINERAL ANALYSES DATA PROCESSING

Heinz-Juergen BERNHARDT

(Invited) MODERN SEM BASED QUANTITATIVE MINERALOGY

Rolf FANDRICH, Gladys Ocharan